Alexei Gruverman |
Dr. Alexei Gruverman is an Associate Professor at the Department of Physics and Astronomy, University of Nebraska-Lincoln. He received his PhD degree in solid state physics from the Ural State University in Ekaterinburg, Russia. His research interests are in the field of scanning probe microscopy of functional materials, nanoscale phenomena in ferroelectrics, non-volatile information storage technologies and electricomechanical phenomena in biological systems. Prior to joining UNL he held research professorship position at North Carolina State University and research scientist positions at Sony Corporation, Yokohama, Japan, and Joint Research Center for Atom Technology in Tsukuba, Japan. While working in Japan he has pioneered the SPM-based method for non-destructive high-resolution imaging of ferroelectric domains in thin films and memory devices – an approach now known as Piezoresponse Force Microscopy (PFM). He has co-authored over 100 papers, a number of book chapters and review articles and has edited three books and several special journal issues on ferroelectricity. He serves as an associate editor for the IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control and is a recipient of the 2004 Ikeda Foundation Award and ISIF 2010 Outstanding Achievement Award. |
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Department of Physics and Astronomy University of Nebraska-Lincoln |
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